The MikroCAD is a high speed, easy to use metrology system used for measuring surface properties of
micro- and macro-scale samples. The data is captured in less than one second, so this is an ideal system for
in-line production monitoring. The MikroCAD was developed out of the necessity for high speed inspection and
metrology. With a global install base of over 600 systems, the MikroCAD has a proven track record in both
Production and R&D environments. Each MikroCAD is custom built by hand to meet your speed, resolution,
and scan size requirements. There are many configuration options that include automated tables, enclosures,
zoom optics, and telescoping column to mention a few.
ODSCAD software, standard on each MikroCAD system, was developed by GFM to instantly process
several million measurement points and spatially reassemble them into accurate 3D data. This software
offers a long list of measurement tools for quantifying 2D and 3D surface features. ODSCAD can analyze
and quantify step height, surface roughness, coplanarity, volume, evenness, microstructures, edge radius,
section angles, CAD comparison, wear, and export data in STL and text formats. ODSCAD software offers
the flexibility required for R&D applications and provides enough automation for demanding production
applications, while maintaining a user friendly intuitive user interface.
ODSCAD has a long list of optional features such as production programs for automated measurements,
an automatic report generator, production line inspection capability, simultaneous measurement and analysis
of several characteristics in one process, and a lab evaluation program for detailed custom analysis.
Industries
Aerospace
Automotive
Cutting Tool
Electronics
General Metrology
Medical
MEMS
Reverse Engineering
Solar/Photovoltaic
Transducer
Turbine Blade
Applications
BGA planarity, bump metrology, and array planarity
Solar bus bar height and width (large area)
Anti reflective coating (ARC) roughness
Clutch wear, gasket flatness, fracture analysis, and gear teeth analysis
Dental implant evaluation
Transducer deformation under load
Tribological wear analysis
Package level warpage
Probe card contact height
Features
Measuring fields: 2.0x1.5mm to 45x33mm
Depth of field: up to 1cm
Short data acquisition time: 60msec/3D profile
Measuring points: 1600 x 1200
Analysis of all essential characteristics of surfaces
Sequence automation
Intuitive software interface
Custom measurement areas and resolutions available
Advantages
High speed non-contact metrology
Capability to be integrated into the production line
Micron or sub-micron resolution in all axes to insure accurate measurements
Automated measurement and analysis of multiple parameters in one process
Teach Mode for fast implementation of new inspection features