High Speed Optical 3D Metrology

The MikroCAD is a high speed, easy to use metrology system used for measuring surface properties of micro- and macro-scale samples. The data is captured in less than one second, so this is an ideal system for in-line production monitoring. The MikroCAD was developed out of the necessity for high speed inspection and metrology. With a global install base of over 600 systems, the MikroCAD has a proven track record in both Production and R&D environments. Each MikroCAD is custom built by hand to meet your speed, resolution, and scan size requirements. There are many configuration options that include automated tables, enclosures, zoom optics, and telescoping column to mention a few.

ODSCAD software, standard on each MikroCAD system, was developed by GFM to instantly process several million measurement points and spatially reassemble them into accurate 3D data. This software offers a long list of measurement tools for quantifying 2D and 3D surface features. ODSCAD can analyze and quantify step height, surface roughness, coplanarity, volume, evenness, microstructures, edge radius, section angles, CAD comparison, wear, and export data in STL and text formats. ODSCAD software offers the flexibility required for R&D applications and provides enough automation for demanding production applications, while maintaining a user friendly intuitive user interface.

ODSCAD has a long list of optional features such as production programs for automated measurements, an automatic report generator, production line inspection capability, simultaneous measurement and analysis of several characteristics in one process, and a lab evaluation program for detailed custom analysis.

Industries

  • Aerospace
  • Automotive
  • Cutting Tool
  • Electronics
  • General Metrology
  • Medical
  • MEMS
  • Reverse Engineering
  • Solar/Photovoltaic
  • Transducer
  • Turbine Blade

Applications

  • BGA planarity, bump metrology, and array planarity
  • Solar bus bar height and width (large area)
  • Anti reflective coating (ARC) roughness
  • Clutch wear, gasket flatness, fracture analysis, and gear teeth analysis
  • Dental implant evaluation
  • Transducer deformation under load
  • Tribological wear analysis
  • Package level warpage
  • Probe card contact height

Features

  • Measuring fields: 2.0x1.5mm to 45x33mm
  • Depth of field: up to 1cm
  • Short data acquisition time: 60msec/3D profile
  • Measuring points: 1600 x 1200
  • Analysis of all essential characteristics of surfaces
  • Sequence automation
  • Intuitive software interface
  • Custom measurement areas and resolutions available

Advantages

  • High speed non-contact metrology
  • Capability to be integrated into the production line
  • Micron or sub-micron resolution in all axes to insure accurate measurements
  • Automated measurement and analysis of multiple parameters in one process
  • Teach Mode for fast implementation of new inspection features

Image of measuring Specifications

Apps Notes

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Product Information

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